Quality reliability and infcom technology : trends and future directions / Edited by P K Kapur, A K Verma, Sunil Kumar Khatri, Ompal Singh.

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Material type: Text

TextLanguage: English Publication details: New Delhi : Narosa Publishing House , 2012.Edition: 1st edDescription: xii,399p. ; HB 25.9 cmISBN:

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Item type	Current library	Collection	Call number	Status	Barcode
Book	St Aloysius Institute of Management & Information Technology	MCA	001.0720053 KAPP (Browse shelf(Opens below))	Available	MCA14297

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