Normal view MARC view ISBD view

Electron microscopy and analysis Ed 3

GOODHEW (Peter J);HUMPHREYS (John);BEANLAND (Richard)

Electron microscopy and analysis Ed 3 - New York Taylor & Francis 2001 - x,251 PB

ISBN: 978-0-7484-0968-6

Subjects--Topical Terms:
Sciences

Dewey Class. No.: 502.825 / GOOE

Place hold
Print
Cite
Add to your cart (remove)
Save record
BIBTEX Dublin Core MARCXML MARC (non-Unicode/MARC-8) MARC (Unicode/UTF-8) MARC (Unicode/UTF-8, Standard) MODS (XML) RIS ISBD
More searches

Search for this title in:
Other Libraries (WorldCat) Other Databases (Google Scholar) Online Stores (Bookfinder.com) Open Library (openlibrary.org)