| 000 | 00667nam a2200229Ia 4500 | ||
|---|---|---|---|
| 003 | OSt | ||
| 005 | 20230503140330.0 | ||
| 008 | 210423s2008 xx 000 0 und d | ||
| 020 | _a978-0-470-02785-1 | ||
| 040 | _cAL | ||
| 041 | _aeng | ||
| 082 |
_a620.11299 _223 _bBRAM |
||
| 100 |
_aBRANDON (David);KAPLAN (Wayne D) _997055 |
||
| 245 | _aMicrostructural characterization of materials Ed 2 | ||
| 250 | _a2 | ||
| 260 |
_aSouthern Gate _bJohn Wiley & Sons _c2008 |
||
| 300 |
_axii,536 _bPB |
||
| 365 |
_b6547.2 _cUSD |
||
| 650 |
_aEngineering Mechanics & Materials _997056 |
||
| 906 | _acharacterization ; Ed2 ; materials ; Microstructural | ||
| 942 |
_2ddc _cBK |
||
| 999 |
_c170881 _d170881 |
||