| 000 | 00610nam a2200217Ia 4500 | ||
|---|---|---|---|
| 003 | OSt | ||
| 005 | 20230522094936.0 | ||
| 008 | 210423s2001 xx 000 0 und d | ||
| 020 | _a978-0-7484-0968-6 | ||
| 040 | _cAL | ||
| 041 | _aeng | ||
| 082 |
_a502.825 _223 _bGOOE |
||
| 100 |
_aGOODHEW (Peter J);HUMPHREYS (John);BEANLAND (Richard) _9109930 |
||
| 245 | _aElectron microscopy and analysis Ed 3 | ||
| 260 |
_aNew York _bTaylor & Francis _c2001 |
||
| 300 |
_ax,251 _bPB |
||
| 365 |
_b5129.59 _cGBP |
||
| 650 |
_aSciences _9109931 |
||
| 906 | _aanalysis ; Ed ; Electron ; microscopy | ||
| 942 |
_2ddc _cBK |
||
| 999 |
_c166901 _d166901 |
||