TY  - BOOK
AU  - Kapur, P K; Verma, A K; Khatri, Sunil Kumar; Singh, Ompal.
TI  - Quality reliability and infcom technology : : trends and future directions 
SN  - 9788184871722
U1  - 001.0720053 1
PY  - 2012///
CY  - New Delhi
PB  - Narosa Publishing House
KW  - Software reliability growth modeling for successive release
KW  - NHPP error detection software model with repair
KW  - Analysis of employees satisfaction in a manufacturing organization
ER  -