Beust, Cedric. <br/><br/>
Next generation java testing :   testng and advanced concepts / 
By Cedric Beust and Hani Suleiman. 
 - 1st ed. 
 - New Delhi :  Pearson Education ,  2008. 
 - xxiii,483p. ;  PB  24.5 cm 
<br/><br/><label>ISBN: </label>9788131721902 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Testing design patterns
<br/><br/><label>Dewey Class. No.: </label>006.671   / BEUC