GOODHEW (Peter J);HUMPHREYS (John);BEANLAND (Richard) <br/><br/>
Electron microscopy and analysis Ed 3 

 - New York  Taylor & Francis  2001 
 - x,251  PB 
<br/><br/><label>ISBN: </label>978-0-7484-0968-6 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Sciences
<br/><br/><label>Dewey Class. No.: </label>502.825   / GOOE