EGERTON (Ray F) <br/><br/>
Physical principles of electron microscopy: an introduction to TEM SEM and AEM 

 - New York  Springer Verlag  2005 
 - lx,202  HB 
<br/><br/><label>ISBN: </label>978-0387-25800-0 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Sciences
<br/><br/><label>Dewey Class. No.: </label>502.825   / EGEP